Multi-Bit RRAM Transient Modelling and Analysis

Citation:
Berikaa, E. R., A. Khalil, H. Hossam, M. Dessouky, and H. Mostafa, "Multi-Bit RRAM Transient Modelling and Analysis", IEEE International Conference on Microelectronics (ICM 2018), Sousse, Tunisia, In Press. copy at www.tinyurl.com/yyzlzc5e
Tourism