Multi-Bit RRAM Transient Modelling and Analysis

Citation:
Berikaa, E. R., A. Khalil, H. Hossam, M. Dessouky, and H. Mostafa, "Multi-Bit RRAM Transient Modelling and Analysis", IEEE International Conference on Microelectronics (ICM 2018), Sousse, Tunisia, In Press. copy at http://scholar.cu.edu.eg/?q=hmostafa/publications/multi-bit-rram-transient-modelling-and-analysis
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