Serag Eldin Habib

Citation:

Shaker, H. H., A. A. Saleh, M. R. Amin, and S. E. D. Habib, "New Proposed Methodology for Radiation Hardening By Design of MOS Circuits", 2020 32nd International Conference on Microelectronics (ICM): IEEE, pp. 1–4, 2020.

Abstract:

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Notes:

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