Serag Eldin Habib

Citation:

Shaker, H., A. A. Saleh, M. R. Amin, S. E. D. Habib, and others, "Improved Buildup Model for Radiation-Induced Defects in MOSFET Isolation Oxides", arXiv preprint arXiv:2009.12652, 2020.

Abstract:

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Notes:

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