@article {shaker2020improved,
	title = {Improved Buildup Model for Radiation-Induced Defects in MOSFET Isolation Oxides},
	journal = {arXiv preprint arXiv:2009.12652},
	year = {2020},
	note = {n/a},
	abstract = {n/a},
	author = {Hesham Shaker and Saleh, AA and Amin, Mohamed Refky and SED Habib and others}
}
