@article {193258,
	title = {Improved Normalized Cross-Correlation for Defect Detection in Printed-Circuit Boards},
	journal = {IEEE Transactions on Semiconductor Manufacturing},
	volume = {32},
	year = {2019},
	pages = {199-211},
	author = {Mahmoud H. Annaby and Yasser M Fouda and Muhammad A. Rushdi}
}
