The Impact of FinFET Technology Scaling on Critical Path Performance under Process Variations

Citation:
Abdelkader, O., H. Abdelhamid, H. Mostafa, and A. M. Soliman, "The Impact of FinFET Technology Scaling on Critical Path Performance under Process Variations", IEEE International Conference on Energy Aware Computing Systems and Applications (ICEAC 2015), Cairo Egypt, IEEE, pp. 1-4, 2015. copy at www.tinyurl.com/jcmv7kk
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