Experimental Study of the Adaptive Body Bias on-Chip (ABBoC) for Bias Temperature Instability (BTI) and Process Variations (PV) Compensation

Citation:
Mostafa, H., "Experimental Study of the Adaptive Body Bias on-Chip (ABBoC) for Bias Temperature Instability (BTI) and Process Variations (PV) Compensation", IEEE International Conference on Modern Circuits and Systems Technologies (MOCAST'2018), Thessaloniki, Greece, pp. 1-4, 2018. copy at www.tinyurl.com/y5dh8rw3
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