@book {28655,
	title = {Design for Yield and Reliability for Nanometer CMOS Digital Circuits},
	year = {2014},
	publisher = {LAP LAMBERT Academic Publishing},
	organization = {LAP LAMBERT Academic Publishing},
	address = {Saarbr{\"u}cken, Germany},
	url = {http://www.amazon.com/Design-Reliability-Nanometer-Digital-Circuits/dp/365951361X},
	attachments = {https://scholar.cu.edu.eg/sites/default/files/hmostafa/files/book_cover_0.jpg},
	author = {Hassan Mostafa and Mohab Anis and Mohamed Elmasry}
}
