Design for Yield and Reliability for Nanometer CMOS Digital Circuits
- Citation:
- Mostafa, H., M. Anis, and M. Elmasry, Design for Yield and Reliability for Nanometer CMOS Digital Circuits, , Saarbrücken, Germany, LAP LAMBERT Academic Publishing, 2014. copy at www.tinyurl.com/hb3bhqe
