A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity
- Citation:
- Mostafa, H., M. Anis, and M. Elmasry, "A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity", Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 19, no. 11: IEEE, pp. 2130–2134, 2011. copy at www.tinyurl.com/gmy25z3
Abstract:
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Notes:
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