Embedded void approach effects on intrinsic stresses in laterally grown GaNon-Si substrate
- Citation:
- Salah, S. I., T. M. Hatem, E. E. Khalil, and S. M. Bedir,
"Embedded void approach effects on intrinsic stresses in laterally grown GaNon-Si substrate",
Materials Science & Engineering B, vol. 242, issue B, pp. 104-110, 2019.
