Shaker, H. H., A. A. Saleh, M. R. Amin, and S. E. D. Habib,
"Improved buildup model for radiation-induced, defects in MOSFET isolation oxides",
Journal of Radiation Research and Applied Sciences, vol. 15, no. 2: Elsevier, pp. 67–75, 2022.
Abstractn/a