A study of using femtosecond LIBS in analyzing metallic thin film–semiconductor interface | Ahmed Hassen Galmed

A study of using femtosecond LIBS in analyzing metallic thin film–semiconductor interface

Citation:: Galmed, A. H., A. K. Kassem, V. H. Bergmann, and M. A. Harith, "A study of using femtosecond LIBS in analyzing metallic thin film–semiconductor interface", Applied Physics B, vol. 102, issue 1, pp. 197-204, 2011.